Abstract
High efficiency silicon solar cells are characterized using current-voltage curves, electroluminescence imaging, impedance spectroscopy, capacitance transients, microwave photoconductive decay, and time-resolved photoluminescence imaging. The sample set is composed of cells from different manufacturers and includes an n-type silicon heterojunction (SHJ), an n-type passivated emitter rear totally diffused (PERT), and five different p-type passivated emitter rear contact (PERC) cells. Carrier lifetimes, both photoconductivity and photoluminescence, are measured co-located with the light excitation pulse and within the cell but away from the light spot. Luminescence intensity and excess carrier lifetimes correlate to cell voltage. The capacitance transient time constants correlate to the capacitance values extracted from impedance spectroscopy.
Original language | American English |
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Number of pages | 6 |
DOIs | |
State | Published - 2023 |
Event | 50th IEEE PVSC - San Juan, Puerto Rico Duration: 11 Jun 2023 → 16 Jun 2023 |
Conference
Conference | 50th IEEE PVSC |
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City | San Juan, Puerto Rico |
Period | 11/06/23 → 16/06/23 |
NREL Publication Number
- NREL/CP-5K00-86468
Keywords
- capacitance
- charge carrier lifetime
- imaging
- impedance spectroscopy
- photoconductivity
- photovoltaic cells
- silicon