Carrier Depletion and Grain Misorientations on Individual Grain Boundaries of Polycrystalline Si Thin Films

Chun Sheng Jiang; Fude Liu; Manuel Romero

doi:10.1109/PVSC.2009.5411640

Carrier Depletion and Grain Misorientations on Individual Grain Boundaries of Polycrystalline Si Thin Films

Chun Sheng Jiang, Fude Liu, Manuel Romero

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	000471-000476
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2009.5411640
State	Published - 2009
Event	34th IEEE Photovoltaic Specialists Conference (PVSC '09) - Philadelphia, Pennsylvania Duration: 7 Jun 2009 → 12 Jun 2009

Conference

Conference	34th IEEE Photovoltaic Specialists Conference (PVSC '09)
City	Philadelphia, Pennsylvania
Period	7/06/09 → 12/06/09

NREL Publication Number

NREL/CP-520-45988

Keywords

materials science
thin films

Access to Document

10.1109/PVSC.2009.5411640

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title = "Carrier Depletion and Grain Misorientations on Individual Grain Boundaries of Polycrystalline Si Thin Films",

keywords = "materials science, thin films",

author = "Jiang, {Chun Sheng} and Fude Liu and Manuel Romero",

year = "2009",

doi = "10.1109/PVSC.2009.5411640",

language = "American English",

pages = "000471--000476",

note = "34th IEEE Photovoltaic Specialists Conference (PVSC '09) ; Conference date: 07-06-2009 Through 12-06-2009",

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TY - CONF

T1 - Carrier Depletion and Grain Misorientations on Individual Grain Boundaries of Polycrystalline Si Thin Films

AU - Jiang, Chun Sheng

AU - Liu, Fude

AU - Romero, Manuel

PY - 2009

Y1 - 2009

KW - materials science

KW - thin films

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U2 - 10.1109/PVSC.2009.5411640

DO - 10.1109/PVSC.2009.5411640

M3 - Paper

SP - 471

EP - 476

T2 - 34th IEEE Photovoltaic Specialists Conference (PVSC '09)

Y2 - 7 June 2009 through 12 June 2009

ER -

Carrier Depletion and Grain Misorientations on Individual Grain Boundaries of Polycrystalline Si Thin Films

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this