Abstract
We employed cathodoluminescence spectroscopy and imaging to investigate the carrier diffusion and radiative recombination in CdTe thin films. We observed that carriers excited by the electron beam diffuse by excitons or by free electrons via donor states at low temperatures. The distribution and concentration of these states in the CdTe films were estimated from the dependence on the excitation level of the donor-to-acceptor radiative recombination.
Original language | American English |
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Pages (from-to) | 3161-3163 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 17 |
DOIs | |
State | Published - 2002 |
NREL Publication Number
- NREL/JA-520-32221