Abstract
Time-resolved photoluminescence (TRPL) with two excitation wavelengths - 670 (standard) and 405 nm - was used to examine the effect on carrier lifetime of two significant recent advances in CdTe: the incorporation of Se to form graded CdSexTe1-x and the use of MgyZn1-yO buffers. The two excitation wavelengths probe depths of approximately 130 and 35 nm, respectively, and their comparison helps differentiate interface and bulk contributions to carrier lifetime. It was found that x = 0.2 Se was required to obtain lifetime improvements, primarily in the bulk. Additionally, TRPL traces for MgyZn1-yO/CdSexTe1-x samples showed fast initial decay followed by a long-lived tail, which may be indicative of trap-dominated recombination. This behavior was not present for CdSexTe1-x films grown on Al2O3, which is currently state-of-the-art for surface passivation in CdTe. This indicates that further work is required to sufficiently passivate the front interface.
Original language | American English |
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Pages | 1301-1303 |
Number of pages | 3 |
DOIs | |
State | Published - 20 Jun 2021 |
Event | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States Duration: 20 Jun 2021 → 25 Jun 2021 |
Conference
Conference | 48th IEEE Photovoltaic Specialists Conference, PVSC 2021 |
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Country/Territory | United States |
City | Fort Lauderdale |
Period | 20/06/21 → 25/06/21 |
Bibliographical note
See NREL/CP-5K00-80545 for preprintNREL Publication Number
- NREL/CP-5K00-81139
Keywords
- cadmium telluride
- CdSeTe
- front interface
- MZO
- TRPL