Cd-Rich and Te-Rich Low-Temperature Photoluminescence in Cadmium Telluride

D. S. Albin, D. Kuciauskas, J. Ma, W. K. Metzger, J. M. Burst, H. R. Moutinho, P. C. Dippo

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Low-temperature photoluminescence emission spectra were measured in cadmium telluride (CdTe) samples in which composition was varied to promote either Cd or Te-rich stoichiometry. The ability to monitor stoichiometry is important, since it has been shown to impact carrier recombination. Te-rich samples show transitions corresponding to acceptor-bound excitons (∼1.58 eV) and free-electron to acceptor transitions (∼1.547 eV). In addition to acceptor-bound excitons, Cd-rich samples show transitions assigned to donor-bound excitons (1.591 eV) and Te vacancies at 1.552 eV. Photoluminescence is a noninvasive way to monitor stoichiometric shifts induced by post-deposition anneals in polycrystalline CdTe thin films deposited by close-spaced sublimation.

Original languageAmerican English
Article number092109
Number of pages4
JournalApplied Physics Letters
Issue number9
StatePublished - 3 Mar 2014

NREL Publication Number

  • NREL/JA-5200-61039


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