CdTe Photoluminescence: Comparison of Solar-Cell Material with Surface-Modified Single Crystals

C. R. Corwine, J. R. Sites, T. A. Gessert, W. K. Metzger, P. Dippo, Jingbo Li, A. Duda, G. Teeter

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21 Scopus Citations

Abstract

Low-temperature photoluminescence (PL) is used to study defect evolution during Cu diffusion into single-crystal CdTe under various atmospheres. PL reveals a zero-order phonon peak at 1.456 eV when Cu-coated CdTe is annealed at 400°C in an oxidizing atmosphere, but not under other tested conditions. A similar peak is seen in polycrystalline thin-film CdTe samples, which are known to contain copper and oxygen impurities. First-principles band structure calculations determined the likely defect assignment as a transition between a Cui-OTe donor complex and the valence band.

Original languageAmerican English
Article number221909
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume86
Issue number22
DOIs
StatePublished - 2005

NREL Publication Number

  • NREL/JA-520-36984

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