Chapter 10: Cross-Sectional Scanning Tunneling Microscopy as a Probe of Local Order in Semiconductor Alloys

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageAmerican English
Title of host publicationSpontaneous Ordering in Semiconductor Alloys
EditorsA. Mascarenhas
Pages273-282
DOIs
StatePublished - 2002

NREL Publication Number

  • NREL/CH-590-37820

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