Abstract
KPFM and SSRM, which relate to the following characterization reviews, will be introduced briefly in Section 10.2. Some recent nm-scale characterizations of perovskite, CIGS, and CdTe thin-film solar cell materials and devices will be reviewed in Sections 10.3-10.5 and closing remarks will be given in Section 10.6.
| Original language | American English |
|---|---|
| Title of host publication | Advanced Characterization of Thin Film Solar Cells |
| Editors | M. Al-Jassim, N. Haegel |
| Pages | 269-292 |
| DOIs | |
| State | Published - 2020 |
NREL Publication Number
- NREL/CH-5K00-80001
Keywords
- atomic force microscopy-based electrical probes
- CdTe thin-film solar cell materials
- CIGS
- KPFM
- nanometer-scale characterization
- perovskite
- SSRM
- thin-film solar cells