Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules

Peter Hacke; Michael Owen-Bellini; Michael Kempe; David Miller; Tadonori Tanahashi; Keiichiro Sakurai; William Gambogi; John Trout; Thomas Felder; Kaushik Choudhury; Nancy Philips; Michael Koehl; Karl-Anders Weiss; Sergiu Spataru; Christos Monokroussos; Gerhard Mathiak

doi:10.1016/B978-0-12-814501-2.00011-6

Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules

Peter Hacke, Michael Owen-Bellini, Michael Kempe, David Miller, Tadonori Tanahashi, Keiichiro Sakurai, William Gambogi, John Trout, Thomas Felder, Kaushik Choudhury, Nancy Philips, Michael Koehl, Karl-Anders Weiss, Sergiu Spataru, Christos Monokroussos, Gerhard Mathiak

Materials Science

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

29 Scopus Citations

Abstract

Application of stress factors in the combinations and sequences as they occur in the natural environment better reproduces failures seen in the field. Further, choice of sample type for testing that best represents the final product is most likely to yield relevant results. Tests meeting these criteria are more likely to discover potential weaknesses that are not a priori known in new module designs, reduce risk, accelerate time to market, achieve bankability and reduce costly overdesign.

Original language	American English
Title of host publication	Advanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies
Editors	D. Ginley, T. Fix
Publisher	Elsevier
Pages	279-313
Number of pages	35
ISBN (Electronic)	9780128145029
ISBN (Print)	9780128145012
DOIs	https://doi.org/10.1016/B978-0-12-814501-2.00011-6 https://doi.org/10.1016/B978-0-12-814501-2.00011-6
State	Published - 2019

Bibliographical note

Publisher Copyright:
© 2019 Elsevier Inc. All rights reserved.

NREL Publication Number

NREL/CH-5K00-72451

Keywords

Accelerated lifetime testing
Combined-accelerated stress testing
Durability
IEC 61215
Photovoltaic modules
Qualification testing
Reliability
Sequential stress testing

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Hacke, P., Owen-Bellini, M., Kempe, M., Miller, D., Tanahashi, T., Sakurai, K., Gambogi, W., Trout, J., Felder, T., Choudhury, K., Philips, N., Koehl, M., Weiss, K.-A., Spataru, S., Monokroussos, C., & Mathiak, G. (2019). Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules. In D. Ginley, & T. Fix (Eds.), Advanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies (pp. 279-313). Elsevier. https://doi.org/10.1016/B978-0-12-814501-2.00011-6, https://doi.org/10.1016/B978-0-12-814501-2.00011-6

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Hacke, P , Owen-Bellini, M , Kempe, M , Miller, D, Tanahashi, T, Sakurai, K, Gambogi, W, Trout, J, Felder, T, Choudhury, K, Philips, N, Koehl, M, Weiss, K-A, Spataru, S, Monokroussos, C & Mathiak, G 2019, Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules. in D Ginley & T Fix (eds), Advanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies. Elsevier, pp. 279-313. https://doi.org/10.1016/B978-0-12-814501-2.00011-6, https://doi.org/10.1016/B978-0-12-814501-2.00011-6

Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules. / Hacke, Peter ; Owen-Bellini, Michael ; Kempe, Michael et al.
Advanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies. ed. / D. Ginley; T. Fix. Elsevier, 2019. p. 279-313.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

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AU - Hacke, Peter

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AU - Tanahashi, Tadonori

AU - Sakurai, Keiichiro

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Hacke P , Owen-Bellini M , Kempe M , Miller D, Tanahashi T, Sakurai K et al. Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules. In Ginley D, Fix T, editors, Advanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies. Elsevier. 2019. p. 279-313 doi: 10.1016/B978-0-12-814501-2.00011-6, 10.1016/B978-0-12-814501-2.00011-6

Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules

Abstract

Bibliographical note

NREL Publication Number

Keywords

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