Chapter 11: Combined and Sequential Accelerated Stress Testing for Derisking Photovoltaic Modules

Peter Hacke, Michael Owen-Bellini, Michael Kempe, David Miller, Tadonori Tanahashi, Keiichiro Sakurai, William Gambogi, John Trout, Thomas Felder, Kaushik Choudhury, Nancy Philips, Michael Koehl, Karl-Anders Weiss, Sergiu Spataru, Christos Monokroussos, Gerhard Mathiak

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

27 Scopus Citations

Abstract

Application of stress factors in the combinations and sequences as they occur in the natural environment better reproduces failures seen in the field. Further, choice of sample type for testing that best represents the final product is most likely to yield relevant results. Tests meeting these criteria are more likely to discover potential weaknesses that are not a priori known in new module designs, reduce risk, accelerate time to market, achieve bankability and reduce costly overdesign.

Original languageAmerican English
Title of host publicationAdvanced Micro- and Nanomaterials for Photovoltaics: Micro and Nano Technologies
EditorsD. Ginley, T. Fix
PublisherElsevier
Pages279-313
Number of pages35
ISBN (Electronic)9780128145029
ISBN (Print)9780128145012
DOIs
StatePublished - 2019

Bibliographical note

Publisher Copyright:
© 2019 Elsevier Inc. All rights reserved.

NREL Publication Number

  • NREL/CH-5K00-72451

Keywords

  • Accelerated lifetime testing
  • Combined-accelerated stress testing
  • Durability
  • IEC 61215
  • Photovoltaic modules
  • Qualification testing
  • Reliability
  • Sequential stress testing

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