Original language | American English |
---|---|
Title of host publication | Advanced Characterization Techniques for Thin Film Solar Cells |
Editors | U. Rau, D. Abou-Ras, T. Kirchartz |
Pages | 299-345 |
DOIs | |
State | Published - 2011 |
NREL Publication Number
- NREL/CH-520-48196
Keywords
- electron microscopy
- imaging
- photovoltaics
- PV
- scanning
- solar
- thin films