Abstract
In the various chapters of this book, numerous characterization techniques are presented that can be applied to thin-film solar cells to determine (micro)structural, compositional, electrical, and optoelectronic properties. What has yet to be more fully elucidated is to what extent these characterization techniques can be combined, in a correlative way, to enhance the information gathered on materials and devices. Indeed, it is valuable to consider combining techniques to verify the relevance of the measured materials properties or to obtain them on different length scales-to compare surface with bulk properties, or to correlate structure and composition of materials with electrical and optoelectronic properties.
| Original language | American English |
|---|---|
| Title of host publication | Advanced Characterization of Thin Film Solar Cells |
| Editors | M. Al-Jassim, N. Haegel |
| Pages | 427-430 |
| DOIs | |
| State | Published - 2020 |
NREL Publication Number
- NREL/CH-5K00-75175
Keywords
- compositional properties
- electrical properties
- measured materials properties
- microstructural properties
- optoelectronic properties
- semiconductor thin films
- thin film solar cells