Chapter 15: Summary and Outlook

Steve Harvey, Daniel Abou-Ras

Research output: Chapter in Book/Report/Conference proceedingChapter


In the various chapters of this book, numerous characterization techniques are presented that can be applied to thin-film solar cells to determine (micro)structural, compositional, electrical, and optoelectronic properties. What has yet to be more fully elucidated is to what extent these characterization techniques can be combined, in a correlative way, to enhance the information gathered on materials and devices. Indeed, it is valuable to consider combining techniques to verify the relevance of the measured materials properties or to obtain them on different length scales-to compare surface with bulk properties, or to correlate structure and composition of materials with electrical and optoelectronic properties.
Original languageAmerican English
Title of host publicationAdvanced Characterization of Thin Film Solar Cells
EditorsM. Al-Jassim, N. Haegel
StatePublished - 2020

NREL Publication Number

  • NREL/CH-5K00-75175


  • compositional properties
  • electrical properties
  • measured materials properties
  • microstructural properties
  • optoelectronic properties
  • semiconductor thin films
  • thin film solar cells


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