Abstract
This chapter describes some photoluminescence (PL) approaches to characterize thin film solar cells with emphasis on time-resolved methods. Spectral PL analysis is complementary and was recently reviewed. Since TRPL is not very commonly used in PV characterization, we consider interface and bulk recombination in the test structures and in devices, briefly describe charge-carrier transport and recombination microscopy, and finally, summarize and compare some CdTe, CdSeTe, CIGS, kesterite, and perovskite EO characteristics.
| Original language | American English |
|---|---|
| Title of host publication | Advanced Characterization of Thin Film Solar Cells |
| Editors | M. Al-Jassim, N. Haegel |
| Pages | 191-222 |
| DOIs | |
| State | Published - 2020 |
NREL Publication Number
- NREL/CH-5900-80000
Keywords
- bulk recombination
- CdSeTe
- CdTe
- charge-carrier transport
- Cu2(ZnFe)SnS4
- CuIn1-xGaxSe2
- interface recombination
- perovskite EO characteristics
- polycrystalline thin-film solar cells
- recombination microscopy
- time-resolved photoluminescence characterization