Chapter 9: Reliability

David Miller, Sarah Kurtz, Nicholas Bosco, Carlos Algora, Pilar Espinet-Gonzalez, Manuel Vázquez, Francisca Rubio, Robert McConnell

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

9 Scopus Citations


This chapter describes the accumulated knowledge on CPV reliability with its fundamentals and qualification. It explains the reliability of solar cells, modules (including optics) and plants. The chapter discusses the statistical distributions, namely exponential, normal and Weibull. The reliability of solar cells includes: namely the issues in accelerated aging tests in CPV solar cells, types of failure and failures in real time operation. The chapter explores the accelerated life tests, namely qualitative life tests (mainly HALT) and quantitative accelerated life tests (QALT). It examines other well proven and experienced PV cells and/or semiconductor devices, which share similar semiconductor materials, manufacturing techniques or operating conditions, namely, III-V space solar cells and light emitting diodes (LEDs). It addresses each of the identified reliability issues and presents the current state of the art knowledge for their testing and evaluation. Finally, the chapter summarizes the CPV qualification and reliability standards.

Original languageAmerican English
Title of host publicationHandbook of Concentrator Photovoltaic Technology
EditorsC. Algora, I. Rey-Stolle
Number of pages68
ISBN (Electronic)9781118755655
ISBN (Print)9781118472965
StatePublished - 2016

Bibliographical note

Publisher Copyright:
© 2016 John Wiley & Sons, Ltd. All rights reserved.

NREL Publication Number

  • NREL/CH-5J00-65086


  • CPV qualification
  • CPV reliability
  • CPV solar cells
  • III-V space solar cells
  • Reliability standards
  • Statistical distributions


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