Characterization for the Onset of Crystallization of Amorphous to Microcrystalline Silicon by Optical Spectroscopies

    Research output: Contribution to conferencePaper

    Abstract

    We study the amorphous to microcrystalline silicon films made at three laboratories by using Raman, photoluminescence- and optical-abosrption spectroscopies.
    Original languageAmerican English
    Pages201-202
    Number of pages2
    StatePublished - 2000
    EventProgram and NCPV Program Review Meeting 2000 - Denver Colorado
    Duration: 16 Apr 200019 Apr 2000

    Conference

    ConferenceProgram and NCPV Program Review Meeting 2000
    CityDenver Colorado
    Period16/04/0019/04/00

    NREL Publication Number

    • NREL/CP-520-29666

    Keywords

    • amorphous Si
    • applications
    • cadmium telluride (CdTe) photovoltaic solar cells modules
    • components
    • concentrators
    • copper indium diselenide (CIS)
    • crystalline silicon (x-Si) (c-Si)
    • manufacturing
    • markets
    • NCPV
    • photovoltaics (PV)
    • research and development (R&D)
    • systems
    • systems integration
    • thin films

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