Abstract
We have investigated CdS thin films as possible passivating window layers for InP. The films were deposited on single crystal InP by chemical bath deposition (CBD). The film thickness, as optically determined by ellipsometry, was varied from 500 to 840 angstrom. The film morphology was investigated by high resolution scanning electron microscopy (SEM), whereas the film microstructure was studied by X-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). Most of the films were fine-grained polycrystalline CdS, with some deposition conditions resulting in epitaxial growth. Cross-sectional TEM examination revealed the presence of interface contaminants. The effect of such contaminants on the film morphology and microstructure was studied, and various approaches for InP surface cleaning/treatment were investigated. The epitaxial were determined to be hexagonal on both the (111) and (100) InP substrates; however, they were heavily faulted.
| Original language | American English |
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| Pages | 285-290 |
| Number of pages | 6 |
| State | Published - 1998 |
| Event | Proceedings of the 1997 MRS Fall Meeting - Boston, MA, USA Duration: 2 Dec 1997 → 5 Dec 1997 |
Conference
| Conference | Proceedings of the 1997 MRS Fall Meeting |
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| City | Boston, MA, USA |
| Period | 2/12/97 → 5/12/97 |
NREL Publication Number
- NREL/CP-520-25600