Characterization of Engineered Pinholes in Dielectric Stacks of High-Performance Poly-Silicon Passivating Contacts

Engineering

• Dielectrics 100%
• Polysilicon 100%
• Charge Carrier 80%
• Photovoltaics 60%
• Dopants 40%
• Saturation Current Density 40%
• Dielectric Layer 40%
• Passivation 20%
• Si Substrate 20%
• Crystalline Silicon 20%
• Etching Process 20%
• Silicon Solar Cell 20%
• Excess Carrier 20%
• Disruptions 20%
• Enhanced Diffusion 20%
• Nanoscale 20%
• Surface Morphology 20%
• Tunnel Construction 20%

Material Science

• Silicon 100%
• Density 100%
• Dielectric Material 100%
• Charge Carrier 66%
• Carrier Transport 66%
• Photovoltaics 50%
• Annealing 33%
• Electrical Resistivity 33%
• Doping (Additives) 33%
• Surface Morphology 16%
• Transmission Electron Microscopy 16%
• Boron 16%
• Silicon Solar Cell 16%
• Oxide Compound 16%