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Characterization of Engineered Pinholes in Dielectric Stacks of High-Performance Poly-Silicon Passivating Contacts
Harvey Guthrey
, Caroline Lima Salles
,
William Nemeth
, Sumit Agarwal
,
David Young
,
Paul Stradins
Materials Science
Chemistry and Nanoscience
National Renewable Energy Laboratory
Colorado School of Mines
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Dive into the research topics of 'Characterization of Engineered Pinholes in Dielectric Stacks of High-Performance Poly-Silicon Passivating Contacts'. Together they form a unique fingerprint.
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Engineering
Dielectrics
100%
Polysilicon
100%
Charge Carrier
80%
Photovoltaics
60%
Dopants
40%
Saturation Current Density
40%
Dielectric Layer
40%
Passivation
20%
Si Substrate
20%
Crystalline Silicon
20%
Etching Process
20%
Silicon Solar Cell
20%
Excess Carrier
20%
Disruptions
20%
Enhanced Diffusion
20%
Nanoscale
20%
Surface Morphology
20%
Tunnel Construction
20%
Material Science
Silicon
100%
Density
100%
Dielectric Material
100%
Charge Carrier
66%
Carrier Transport
66%
Photovoltaics
50%
Annealing
33%
Electrical Resistivity
33%
Doping (Additives)
33%
Surface Morphology
16%
Transmission Electron Microscopy
16%
Boron
16%
Silicon Solar Cell
16%
Oxide Compound
16%