Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation

Yanfa Yan; M. M. Al-Jassim; K. M. Jones

doi:10.1016/S0040-6090(01)00841-0

Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation

Yanfa Yan, M. M. Al-Jassim, K. M. Jones

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

25 Scopus Citations

Abstract

The extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation are characterized by means of high-resolution transmission electron microscopy. We found that the extended defects are mostly lamellar twins and intrinsic and extrinsic stacking faults. The stacking faults always propagate across the grains without ending at a partial dislocation inside the grains. The atomic structures of the defects are confirmed.

Original language	American English
Pages (from-to)	75-77
Number of pages	3
Journal	Thin Solid Films
Volume	389
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(01)00841-0 https://doi.org/10.1016/S0040-6090(01)00841-0
State	Published - 2001

NREL Publication Number

NREL/JA-520-29299

Keywords

Cadmium telluride (CdTe)
Structure properties
Transmission electron microscopy (TEM)

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title = "Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation",

abstract = "The extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation are characterized by means of high-resolution transmission electron microscopy. We found that the extended defects are mostly lamellar twins and intrinsic and extrinsic stacking faults. The stacking faults always propagate across the grains without ending at a partial dislocation inside the grains. The atomic structures of the defects are confirmed.",

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author = "Yanfa Yan and Al-Jassim, {M. M.} and Jones, {K. M.}",

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T1 - Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation

AU - Yan, Yanfa

AU - Al-Jassim, M. M.

AU - Jones, K. M.

PY - 2001

Y1 - 2001

N2 - The extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation are characterized by means of high-resolution transmission electron microscopy. We found that the extended defects are mostly lamellar twins and intrinsic and extrinsic stacking faults. The stacking faults always propagate across the grains without ending at a partial dislocation inside the grains. The atomic structures of the defects are confirmed.

AB - The extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation are characterized by means of high-resolution transmission electron microscopy. We found that the extended defects are mostly lamellar twins and intrinsic and extrinsic stacking faults. The stacking faults always propagate across the grains without ending at a partial dislocation inside the grains. The atomic structures of the defects are confirmed.

KW - Cadmium telluride (CdTe)

KW - Structure properties

KW - Transmission electron microscopy (TEM)

UR - http://www.scopus.com/inward/record.url?scp=0035876639&partnerID=8YFLogxK

U2 - 10.1016/S0040-6090(01)00841-0

DO - 10.1016/S0040-6090(01)00841-0

M3 - Article

AN - SCOPUS:0035876639

SN - 0040-6090

VL - 389

SP - 75

EP - 77

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation

Abstract

NREL Publication Number

Keywords

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