Characterization of Extended Defects in Polycrystalline CdTe Thin Films Grown by Close-Spaced Sublimation

Yanfa Yan, M. M. Al-Jassim, K. M. Jones

Research output: Contribution to journalArticlepeer-review

24 Scopus Citations

Abstract

The extended defects in polycrystalline CdTe thin films grown by close-spaced sublimation are characterized by means of high-resolution transmission electron microscopy. We found that the extended defects are mostly lamellar twins and intrinsic and extrinsic stacking faults. The stacking faults always propagate across the grains without ending at a partial dislocation inside the grains. The atomic structures of the defects are confirmed.

Original languageAmerican English
Pages (from-to)75-77
Number of pages3
JournalThin Solid Films
Volume389
Issue number1-2
DOIs
StatePublished - 2001

NREL Publication Number

  • NREL/JA-520-29299

Keywords

  • Cadmium telluride (CdTe)
  • Structure properties
  • Transmission electron microscopy (TEM)

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