Characterization of Field Exposed Thin Film Modules

Research output: Contribution to conference › Paper

Original language	American English
Pages	002411-002415
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2012.6318083
State	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference (PVSC '12) - Austin, Texas Duration: 3 Jun 2012 → 8 Jun 2012

Conference	38th IEEE Photovoltaic Specialists Conference (PVSC '12)
City	Austin, Texas
Period	3/06/12 → 8/06/12

See CP-5200-54144 for preprint

NREL Publication Number

@conference{6556e9c7b8184b4ebe2cd92eb873edc1,

title = "Characterization of Field Exposed Thin Film Modules",

author = "NREL",

note = "See CP-5200-54144 for preprint; 38th IEEE Photovoltaic Specialists Conference (PVSC '12) ; Conference date: 03-06-2012 Through 08-06-2012",

year = "2012",

doi = "10.1109/PVSC.2012.6318083",

language = "American English",

pages = "002411--002415",

}