Characterization of Field Exposed Thin Film Modules: Preprint

    Research output: Contribution to conferencePaper


    Test arrays of thin film modules have been deployed at the Solar Energy Centre near New Delhi, India since 2002-2003. Performances of these arrays were reported by O.S. Sastry [1]. This paper reports on NREL efforts to support SEC by performing detailed characterization of selected modules from the array. Modules were selected to demonstrate both average and worst case power loss over the 8 yearsof outdoor exposure. The modules characterized included CdTe, CIS and three different types of a-Si. All but one of the a-Si types were glass-glass construction. None of the modules had edge seals. Detailed results of these tests are presented along with our conclusions about the causes of the power loss for each technology.
    Original languageAmerican English
    Number of pages7
    StatePublished - 2012
    Event2012 IEEE Photovoltaic Specialists Conference - Austin, Texas
    Duration: 3 Jun 20128 Jun 2012


    Conference2012 IEEE Photovoltaic Specialists Conference
    CityAustin, Texas

    NREL Publication Number

    • NREL/CP-5200-54144


    • outdoor field exposure
    • photovoltaics
    • PV module performance
    • thin film


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