Characterization of Impurities and Grain Boundaries in Silicon Using Volume-Indexed Surface Analysis Techniques

Research output: Contribution to conference › Paper

Original language	American English
Pages	655-660
Number of pages	6
State	Published - 1986
Event	2nd International Photovoltaic Science and Engineering Conference - Beijing, China Duration: 19 Aug 1986 → 22 Aug 1986

Conference	2nd International Photovoltaic Science and Engineering Conference
City	Beijing, China
Period	19/08/86 → 22/08/86

NREL Publication Number

@conference{965c953992774e128a8b8e334deab093,

title = "Characterization of Impurities and Grain Boundaries in Silicon Using Volume-Indexed Surface Analysis Techniques",

author = "NREL",

year = "1986",

language = "American English",

pages = "655--660",

note = "2nd International Photovoltaic Science and Engineering Conference ; Conference date: 19-08-1986 Through 22-08-1986",

}