Characterization of Laser Edge Isolation in Multicrystalline Silicon Solar Cells

J. Gorman; Helio Moutinho; Chun Sheng Jiang; Yanfa Yan

doi:10.1109/PVSC.2010.5616118

Characterization of Laser Edge Isolation in Multicrystalline Silicon Solar Cells

J. Gorman, Helio Moutinho, Chun Sheng Jiang, Yanfa Yan

Materials Science

Research output: Contribution to conference › Paper

Original language	American English
Pages	001721-001726
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2010.5616118
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-47701

Keywords

edge isolation
scanning capacitance microscopy
solar cells

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10.1109/PVSC.2010.5616118

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title = "Characterization of Laser Edge Isolation in Multicrystalline Silicon Solar Cells",

keywords = "edge isolation, scanning capacitance microscopy, solar cells",

author = "J. Gorman and Helio Moutinho and Jiang, {Chun Sheng} and Yanfa Yan",

year = "2010",

doi = "10.1109/PVSC.2010.5616118",

language = "American English",

pages = "001721--001726",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC '10) ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Characterization of Laser Edge Isolation in Multicrystalline Silicon Solar Cells

AU - Gorman, J.

AU - Moutinho, Helio

AU - Jiang, Chun Sheng

AU - Yan, Yanfa

PY - 2010

Y1 - 2010

KW - edge isolation

KW - scanning capacitance microscopy

KW - solar cells

UR - http://www.scopus.com/inward/record.url?scp=78650141512&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2010.5616118

DO - 10.1109/PVSC.2010.5616118

M3 - Paper

SP - 1721

EP - 1726

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -

Characterization of Laser Edge Isolation in Multicrystalline Silicon Solar Cells

Conference

NREL Publication Number

Keywords

Access to Document

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