Abstract
Synchrotron radiation soft x-ray photoemission spectroscopy was used to investigate the native oxide of n-type single-crystal CuInSe2. Photoemission measurements were acquired on the oxide surface before and after removal using sputter etching. Observed changes in the valence-band electronic structure as well as changes in the In 4d and Se 3d core lines were correlated with the interface chemistry at the oxide/CuInSe2 interface. These results show the native oxide to be composed of an In2O3 outer layer (no SeO2) with an additional Cu2Se interface layer.
Original language | American English |
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Pages (from-to) | 1428-1430 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 57 |
Issue number | 14 |
DOIs | |
State | Published - 1990 |
Bibliographical note
Work performed by Solar Energy Research Institute, Golden, Colorado; Physics Department, University of Calabria, Cosenza, Italy; Synchrotron Radiation Center, University of Wisconsin-Madison, Stoughton, WisconsinNREL Publication Number
- ACNR/JA-213-11758