Characterization of Native Oxide of CuInSe2 using Synchrotron Radiation Photoemission

Art J. Nelson, Steven Gebhard, L. L. Kazmerski, Elio Colavita, Mike Engelhardt, Hartmut Höchst

Research output: Contribution to journalArticlepeer-review

32 Scopus Citations


Synchrotron radiation soft x-ray photoemission spectroscopy was used to investigate the native oxide of n-type single-crystal CuInSe2. Photoemission measurements were acquired on the oxide surface before and after removal using sputter etching. Observed changes in the valence-band electronic structure as well as changes in the In 4d and Se 3d core lines were correlated with the interface chemistry at the oxide/CuInSe2 interface. These results show the native oxide to be composed of an In2O3 outer layer (no SeO2) with an additional Cu2Se interface layer.

Original languageAmerican English
Pages (from-to)1428-1430
Number of pages3
JournalApplied Physics Letters
Issue number14
StatePublished - 1990

Bibliographical note

Work performed by Solar Energy Research Institute, Golden, Colorado; Physics Department, University of Calabria, Cosenza, Italy; Synchrotron Radiation Center, University of Wisconsin-Madison, Stoughton, Wisconsin

NREL Publication Number

  • ACNR/JA-213-11758


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