Characterization of Semiconductor Grain Boundaries Using Volume-Indexed Surface Analysis Techniques

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	271-279
Number of pages	9
Journal	Revista Brasileira de Aplicacoes de Vacuo
Volume	5
Issue number	1/2
State	Published - 1985

NREL Publication Number

@article{b2c4d838fc7147b6bb1f7d1498b80100,

title = "Characterization of Semiconductor Grain Boundaries Using Volume-Indexed Surface Analysis Techniques",

author = "NREL",

year = "1985",

language = "American English",

volume = "5",

pages = "271--279",

journal = "Revista Brasileira de Aplicacoes de Vacuo",

issn = "0101-7659",

publisher = "Sociedade Brasileira de Vacuo",

number = "1/2",

}