Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009

Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009

Research output: NREL › Subcontract Report

Abstract

Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.

Original language	American English
Number of pages	59
State	Published - 2009

Bibliographical note

Work performed by University of Nevada - Las Vegas, Las Vegas, Nevada

NREL Publication Number

NREL/SR-520-46434

Keywords

CdTe
CIGSS
electronic structure
interfaces
inverse photoemission
photoelectron spectroscopic (UPS)
PV
solar cells
thin films
x-ray absorption and emission

Access to Document

https://www.nrel.gov/docs/fy09osti/46434.pdf

Cite this

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title = "Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009",

abstract = "Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.",

keywords = "CdTe, CIGSS, electronic structure, interfaces, inverse photoemission, photoelectron spectroscopic (UPS), PV, solar cells, thin films, x-ray absorption and emission",

author = "NREL",

note = "Work performed by University of Nevada - Las Vegas, Las Vegas, Nevada",

year = "2009",

language = "American English",

type = "Other",

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TY - GEN

T1 - Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009

AU - NREL, null

N1 - Work performed by University of Nevada - Las Vegas, Las Vegas, Nevada

PY - 2009

Y1 - 2009

N2 - Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.

AB - Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.

KW - CdTe

KW - CIGSS

KW - electronic structure

KW - interfaces

KW - inverse photoemission

KW - photoelectron spectroscopic (UPS)

KW - PV

KW - solar cells

KW - thin films

KW - x-ray absorption and emission

M3 - Subcontract Report

ER -

Characterization of the Electronic and Chemical Structure at the Thin Film Solar Cell Interfaces: June 2005 -- June 2009

Abstract

Bibliographical note

NREL Publication Number

Keywords

Access to Document

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Cite this