Abstract
Study using photoelectron spectroscopy, inverse photoemission, and X-ray absorption and emission to derive the electronic structure of interfaces in CIGSS and CdTe thin-film solar cells.
| Original language | American English |
|---|---|
| Publisher | National Renewable Energy Laboratory (NREL) |
| Number of pages | 59 |
| State | Published - 2009 |
Bibliographical note
Work performed by University of Nevada - Las Vegas, Las Vegas, NevadaNLR Publication Number
- NREL/SR-520-46434
Keywords
- CdTe
- CIGSS
- electronic structure
- interfaces
- inverse photoemission
- photoelectron spectroscopic (UPS)
- PV
- solar cells
- thin films
- x-ray absorption and emission