@misc{c6d9c2e645f949879705aee0df72da6b,
title = "Characterization of Tunnel Oxides in TOPCon Solar Cells",
abstract = "The 1.12 nm thickness for the tunnel oxide layer is near the optimal range described by Choi et al. This thickness should be effective at enabling quantum tunneling; however, it is slightly lower than the reported optimal range which could negatively impact the passivation of the poly-Si interface. An appropriate balance between the two functions must be met to optimize efficiency. Follow up work could focus on testing the optimal range for tunnel oxide thickness in TOPCon solar cells, as well as improving the manufacturing process to produce better control of film thickness. This work could be extended into more advanced TOPCon solar cells including double or triple stack structures, as well as experimental pinhole designs.",
keywords = "spectroscopic ellipsometry, TOPCon solar cell, tunnel oxide",
author = "Eric Rada and Arihana Roos and William Nemeth and David Young and Jason Stoke",
year = "2024",
language = "American English",
series = "Presented at the Murdock College Science Research Conference, 8-9 November 2024, Vancouver, Washington",
publisher = "National Renewable Energy Laboratory (NREL)",
address = "United States",
type = "Other",
}