Abstract
Further improvement of the open-circuit voltage (V oc ) of thin-film photovoltaic devices requires that the rate of non-radiative recombination be monitored and reduced. In this study, we investigate a method that attempts to account for the excitation and temperature dependence of V oc and photoluminescence (PL), to extract detailed information about the spatial distribution of recombination and the effects of back contact offset.
Original language | American English |
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Pages | 2473-2477 |
Number of pages | 5 |
DOIs | |
State | Published - 2018 |
Event | 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) - Washington, D.C. Duration: 25 Jun 2017 → 30 Jun 2017 |
Conference
Conference | 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) |
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City | Washington, D.C. |
Period | 25/06/17 → 30/06/17 |
NREL Publication Number
- NREL/CP-5K00-73999
Keywords
- down shifting
- light scattering
- solar cells
- ZnO nanoislands