Abstract
We report the results of spectroscopic time-resolved photoluminescence (TRPL) analysis for polycrystalline CuIn1-xGaxSe 2 (CIGS) films. On the <5 ns time scale, we investigated minority carrier spatial redistribution from the initial absorption profile near the surface of the films to the conduction band minimum. Based on these data, the estimated minority carrier mobility is 75-230 cm2V-1 s-1. Full TRPL decays were analyzed using models for donor-acceptor pair (DAP) recombination. We estimated that the concentration of DAP recombination centers was 5 × 1015-1017 cm -3. Data also show that Shockley-Reed-Hall and surface recombination are not significant for polycrystalline CIGS absorbers used in high-efficiency photovoltaic solar cells.
Original language | American English |
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Article number | 154505 |
Number of pages | 6 |
Journal | Journal of Applied Physics |
Volume | 114 |
Issue number | 15 |
DOIs | |
State | Published - 21 Oct 2013 |
NREL Publication Number
- NREL/JA-5200-59036
Keywords
- photovoltaic
- polycrystalline
- PV
- solar
- solar cell
- thin-film