Abstract
We discuss models for the infrared spectrum peaked at 0.8 eV reported in voltage-modulated optical absorption measurements on a-Si:H based diodes. We associate this spectrum with interface charge modulation of the optical properties of the phosphorus-doped a-Si:H used as one electrode. We propose that the spectrum originates with the internal optical transitions of a complex incorporating four-fold coordinated phosphorus and a dangling bond. We discuss prior evidence against complexing, and suggest further experiments.
| Original language | American English |
|---|---|
| Pages (from-to) | 227-231 |
| Number of pages | 5 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 266-269 |
| DOIs | |
| State | Published - 2000 |
| Externally published | Yes |
| Event | 18th International Conference on Amorphous and Microcrystalline Semiconductors - Sicence and Technology (ICAMS 18) - Snowbird, UT, United States Duration: 23 Aug 1999 → 27 Aug 1999 |
Bibliographical note
Work performed by Syracuse University, Syracuse, New YorkNREL Publication Number
- NREL/JA-520-28659