Chemical Bath Deposition of CdS Thin Films: Growth and Structural Studies

    Research output: Contribution to conferencePaper

    Abstract

    Chemical-bath-deposited CdS thin films from an ammonia-thiourea solution have been studied by x-ray diffraction, surface profilometry, ellipsometry, and other techniques. The compactness of the CdS films, structural properties of the films, and the growth mechanism have been investigated. For the deposition conditions used, we found that the film compactness reaches its maximum at a depositiontime of 35 minutes. Films grown at longer deposition times are less compact, consistent with the CdS duplex layer structure proposed previously. This transition from compact layer growth to porous layer growth is important for depositing CdS films in solar cell applications. Based on x-ray diffraction (XRD) studies, we were able to determine the crystal phase, lattice constant, and otherstructural properties.
    Original languageAmerican English
    Pages227-232
    Number of pages6
    StatePublished - 1996
    EventThin Films for Photovoltaic and Related Device Applications: Materials Research Society Symposium - San Francisco, California
    Duration: 8 Apr 199611 Apr 1996

    Conference

    ConferenceThin Films for Photovoltaic and Related Device Applications: Materials Research Society Symposium
    CitySan Francisco, California
    Period8/04/9611/04/96

    Bibliographical note

    Work performed by Colorado School of Mines, Golden, Colorado

    NREL Publication Number

    • NREL/CP-23032

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