Abstract
This CRADA will focus on processing, advanced characterization, and testing of photovoltaic materials and devices to understand and improve REEL CdTe solar technology. This will include examining process variations and different buffer, absorber, and contact layers from REEL and NLR to maximize performance. The unique and diverse advanced characterization tools at NLR, such as time-resolved photoluminescence, capacitance-voltage measurements, electron beam scattered diffraction, cathodoluminescence, electron microscopy, TOF-SIMS, and other measurements will be applied to characterize REEL processing to improve understanding and guide experimental directions. Accelerated stability and potential induced degradation tests will be used to analyze metastability, short-and-long term degradation, and improve bankability. A second and major thrust this period will be joint development of Si/CdTe tandem solar cells to overcome industry wide terrestrial solar efficiency limits with the two lowest cost and manufacturable solar materials today. This will include developing novel transparent back contacts that can be incorporated into tandem structures and other novel solar applications, detailed analysis of designs and configurations for CdTe/Si tandem modules, and prototyping REEL CdTe Technology with Si bottom cells in tandem structures.
| Original language | American English |
|---|---|
| Number of pages | 13 |
| DOIs | |
| State | Published - 2026 |
NLR Publication Number
- NLR/TP-5700-98622
Keywords
- capacitance-voltage measurements
- cathodoluminescence
- CdTe photovoltaics
- CRADA
- electron microscopy
- energy dispersive x-ray spectroscopy (EDS)
- high angle annular dark field imaging (HAADF)
- indium tin oxide (ITO)
- morphology
- Na migration
- photoluminescence (PL)
- scanning transmission electron microscopy
- silicon and cadmium telluride (Si/CdTe) tandem cells
- time-of-flight secondary ion mass spectrometry (TOF-SIMS)
- transparent back contacts
- transparent conductive oxide (TCO) corrosion