Abstract
Copper nitride (Cu3N) is a potential next-generation Earth abundant thin film solar cell absorber material. We performed reduction of Cu3N combinatorial optical and structural vector data to scalar metrics, and subsequent correlation of these metrics with other scalar quantities, such as isotropic bulk electrical conductivity or target-substrate distance during the growth. Insensitivity of the Cu3N conductivity to the structural and optical metrics is promising for large-scale fabrication of thin film solar cells where precise process control over the growth parameters may be challenging.
Original language | American English |
---|---|
Pages | 2498-2500 |
Number of pages | 3 |
DOIs | |
State | Published - 2013 |
Event | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 16 Jun 2013 → 21 Jun 2013 |
Conference
Conference | 39th IEEE Photovoltaic Specialists Conference, PVSC 2013 |
---|---|
Country/Territory | United States |
City | Tampa, FL |
Period | 16/06/13 → 21/06/13 |
NREL Publication Number
- NREL/CP-5200-57905
Keywords
- Copper compounds
- Data handling
- Nitrogen
- Solar energy
- Sputtering
- Thin films
- Throughput