@misc{616ab4436dea42c28d43b4c2c8e218df,
title = "Combined-Accelerated Stress Testing for Advanced Reliability Assessment of Photovoltaic Modules",
abstract = "New and previously undiscovered degradation mechanisms continue to be identified after field exposure in new photovoltaic module designs or materials oftentimes results in significant losses in investment. This is despite passing certification tests. Testing is insufficient largely due to their single-or double-stress nature. A Combined-Accelerated Stress Test (C-AST) has recently been developed. The test combines multiple stress factors of the natural environment to better replicate conditions experienced by modules in the field and detect mechanisms not a-priori known in new materials and designs.",
keywords = "accelerator factor modeling, C-AST, combined-accelerated stress test, module reliability, reliability modeling",
author = "Michael Owen-Bellini and Peter Hacke and Sergiu Spataru and Dana Sulas and Hannah North and David Miller and Michael Kempe",
year = "2020",
language = "American English",
series = "Presented at the 2020 PV Reliability Workshop, 25-27 February 2020",
type = "Other",
}
