Abstract
Characterization of photovoltaic (PV) module materials throughout different stages of service life is crucial to understanding and improving the durability of these materials. Currently the large-scale of PV modules (>1 m2) is imbalanced with the small-scale of most materials characterization tools (≤1 cm2). Furthermore, understanding degradation mechanisms often requires a combination of multiple characterization techniques. Here, we present adaptations of three standard materials characterization techniques to enable mapping characterization over moderate sample areas (≥25 cm2). Contact angle, ellipsometry, and UV-vis spectroscopy are each adapted and demonstrated on two representative samples: a commercial multifunctional coating for PV glass and an oxide combinatorial sample library. Best practices are discussed for adapting characterization techniques for large-area mapping and combining mapping information from multiple techniques.
Original language | American English |
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Pages (from-to) | 197-203 |
Number of pages | 7 |
Journal | ACS Combinatorial Science |
Volume | 22 |
Issue number | 4 |
DOIs | |
State | Published - 13 Apr 2020 |
Bibliographical note
Publisher Copyright:© 2020 American Chemical Society.
NREL Publication Number
- NREL/JA-5K00-74968
Keywords
- antireflection
- antisoiling
- coatings
- contact angle
- ellipsometry
- mapping
- PV glass
- UV-vis