Abstract
In this manuscript, we present an overview of our module self-reference (MSR) calibration results of PV electrical performance collected for over three years on a silicon module. Analysis and comparison of the results based on measurement uncertainty analysis enable the quantification of the major sources of uncertainty and an estimate of the total uncertainty of the MSR measurements. The control charts show that the mean values are consistent with uncertainty calculations for PMAX, VOC and ISC.
Original language | American English |
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Pages | 2185-2187 |
Number of pages | 3 |
DOIs | |
State | Published - 14 Jun 2020 |
Event | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020 |
Conference
Conference | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 |
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Country/Territory | Canada |
City | Calgary |
Period | 15/06/20 → 21/08/20 |
Bibliographical note
Publisher Copyright:© 2020 IEEE.
NREL Publication Number
- NREL/CP-5900-79415
Keywords
- calibration
- control chart
- measurement uncertainty
- module self-reference
- photovoltaic module