Comment on 'Optical Characterization of CuIn1-xGaxSe2 Alloy Thin Films by Spectroscopic Ellipsometry' [J. Appl. Phys. 94, 879 (2003)]: Article No. 096102

Dean Levi

doi:10.1063/1.2374223

Comment on 'Optical Characterization of CuIn1-xGaxSe2 Alloy Thin Films by Spectroscopic Ellipsometry' [J. Appl. Phys. 94, 879 (2003)]: Article No. 096102

Dean Levi

Chemistry and Nanoscience

Research output: Contribution to journal › Article › peer-review

Original language	American English
Number of pages	2
Journal	Journal of Applied Physics
Volume	100
Issue number	9
DOIs	https://doi.org/10.1063/1.2374223
State	Published - 2006

NREL Publication Number

NREL/JA-520-41010

Access to Document

10.1063/1.2374223

Cite this

@article{0f51437a1e154bbcbdd241a93181a242,

title = "Comment on 'Optical Characterization of CuIn1-xGaxSe2 Alloy Thin Films by Spectroscopic Ellipsometry' [J. Appl. Phys. 94, 879 (2003)]: Article No. 096102",

author = "Dean Levi",

year = "2006",

doi = "10.1063/1.2374223",

language = "American English",

volume = "100",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "9",

}