Abstract
The Outdoor Test Facility (OTF) at NREL is equipped with data acquisition systems that monitor the performance of modules deployed outdoors in real time, including the measurement of current-voltage traces every 15 minutes during all daylight hours. This affords us the ability to analyze performance across many levels of illumination which allows the determination of factors that affect moduleperformance and that serve as indicators of module quality, including average diode quality factors, series resistances values, and reverse-saturation currents of the cells. This study focuses on several polycrystalline thin-film modules, including cadmium telluride. CIS, and polycrystalline silicon. We present these parameters, acquired from outdoor measurements, and compare the results withmeasurements obtained from more canonical methods.
| Original language | American English |
|---|---|
| Number of pages | 7 |
| State | Published - 2005 |
| Event | 31st IEEE Photovoltaics Specialists Conference and Exhibition - Lake Buena Vista, Florida Duration: 3 Jan 2005 → 7 Jan 2005 |
Conference
| Conference | 31st IEEE Photovoltaics Specialists Conference and Exhibition |
|---|---|
| City | Lake Buena Vista, Florida |
| Period | 3/01/05 → 7/01/05 |
NREL Publication Number
- NREL/CP-520-37444
Keywords
- cadmium telluride (CdTe) photovoltaic solar cells modules
- current-voltage curves
- diode quality
- module
- polycrystalline cells
- PV
- reverse-saturation currents
- series resistances values
- thin films
