Comparison of Diode Quality Plus Other Factors in Polycrystalline Cells and Modules from Outdoor and Indoor Measurements

Research output: Contribution to conferencePaper

Abstract

The Outdoor Test Facility (OTF) at NREL is equipped with data acquisition systems that monitor the performance of modules deployed outdoors in real time, including the measurement of current-voltage traces every 15 minutes during all daylight hours. This affords us the ability to analyze performance across many levels of illumination which allows the determination of factors that affect moduleperformance and that serve as indicators of module quality, including average diode quality factors, series resistances values, and reverse-saturation currents of the cells. This study focuses on several polycrystalline thin-film modules, including cadmium telluride. CIS, and polycrystalline silicon. We present these parameters, acquired from outdoor measurements, and compare the results withmeasurements obtained from more canonical methods.
Original languageAmerican English
Number of pages7
StatePublished - 2005
Event31st IEEE Photovoltaics Specialists Conference and Exhibition - Lake Buena Vista, Florida
Duration: 3 Jan 20057 Jan 2005

Conference

Conference31st IEEE Photovoltaics Specialists Conference and Exhibition
CityLake Buena Vista, Florida
Period3/01/057/01/05

NREL Publication Number

  • NREL/CP-520-37444

Keywords

  • cadmium telluride (CdTe) photovoltaic solar cells modules
  • current-voltage curves
  • diode quality
  • module
  • polycrystalline cells
  • PV
  • reverse-saturation currents
  • series resistances values
  • thin films

Fingerprint

Dive into the research topics of 'Comparison of Diode Quality Plus Other Factors in Polycrystalline Cells and Modules from Outdoor and Indoor Measurements'. Together they form a unique fingerprint.

Cite this