Comparison of Dominant Electron Trap Levels in n-Type and p-Type GaAsN Using Deep-Level Transient Spectroscopy

    Research output: Contribution to conferencePaper

    Fingerprint

    Dive into the research topics of 'Comparison of Dominant Electron Trap Levels in n-Type and p-Type GaAsN Using Deep-Level Transient Spectroscopy'. Together they form a unique fingerprint.

    Engineering

    Material Science