Comparison of Silicon Photoluminescence and Photoconductive Decay for Material Quality Characterization: Paper No. 0994-F07-04

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages163-168
Number of pages6
StatePublished - 2007
EventSemiconductor Defect Engineering - Materials, Synthetic Structures and Devices - San Francisco, California
Duration: 9 Apr 200713 Apr 2007

Conference

ConferenceSemiconductor Defect Engineering - Materials, Synthetic Structures and Devices
CitySan Francisco, California
Period9/04/0713/04/07

NREL Publication Number

  • NREL/CP-520-41419

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