Comparison of Silicon Photoluminescence and Photoconductive Decay for Material Quality Characterization: Paper No. 0994-F07-04

Research output: Contribution to conference › Paper

Original language	American English
Pages	163-168
Number of pages	6
State	Published - 2007
Event	Semiconductor Defect Engineering - Materials, Synthetic Structures and Devices - San Francisco, California Duration: 9 Apr 2007 → 13 Apr 2007

Conference	Semiconductor Defect Engineering - Materials, Synthetic Structures and Devices
City	San Francisco, California
Period	9/04/07 → 13/04/07

NREL Publication Number

@conference{214f15d0374647858adf1a19a0298e4b,

title = "Comparison of Silicon Photoluminescence and Photoconductive Decay for Material Quality Characterization: Paper No. 0994-F07-04",

author = "NREL",

year = "2007",

language = "American English",

pages = "163--168",

note = "Semiconductor Defect Engineering - Materials, Synthetic Structures and Devices ; Conference date: 09-04-2007 Through 13-04-2007",

}