Comparison of Techniques for Measuring Recombination Lifetime in Semiconductors: Abstract No. E11.5

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Number of pages136
    StatePublished - 2005
    EventSemiconductor Defect Engineering Materials, Synthetic Structures and Devices: Materials Research Society Symposium - San Francisco, California
    Duration: 28 Mar 20051 Apr 2005

    Conference

    ConferenceSemiconductor Defect Engineering Materials, Synthetic Structures and Devices: Materials Research Society Symposium
    CitySan Francisco, California
    Period28/03/051/04/05

    NREL Publication Number

    • NREL/CP-520-37151

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