Abstract
Experimental measurements of coplanar waveguide circuits atop thin films of ferroelectric BaxSr1 - xTiO3 (BST) were made as a function ofdc bias from O to 200 Vand frequency from 0.045 to 20 GHz. The resulting phase shifts are compared with method-of-moments electromagnetic simulations and a conformai mapping analysis to determine the dielectric constant of the BST films. The accuracy of the resulting dielectric constants is analyzed and compared to low-frequency measurements of interdigitated capacitor circuits on the same films.
Original language | American English |
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Pages (from-to) | 34-37 |
Number of pages | 4 |
Journal | Microwave and Optical Technology Letters |
Volume | 29 |
Issue number | 1 |
DOIs | |
State | Published - 2001 |
NREL Publication Number
- NREL/JA-520-30637
Keywords
- Coplanar waveguide
- Phase shifter
- Thin-film ferroelectric