Comparison of Transient and Imaging Techniques for Measuring Minority-Carrier Lifetime

Research output: Contribution to conference › Paper

Original language	American English
Pages	151-154
Number of pages	4
State	Published - 2008
Event	18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes - Vail, Colorado Duration: 3 Aug 2008 → 6 Aug 2008

Conference	18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes
City	Vail, Colorado
Period	3/08/08 → 6/08/08

NREL Publication Number

@conference{4e883c1e724f40d99e074f98d30708e2,

title = "Comparison of Transient and Imaging Techniques for Measuring Minority-Carrier Lifetime",

keywords = "minority carrier lifetime, photoconductive decay",

author = "Steven Johnston",

year = "2008",

language = "American English",

pages = "151--154",

note = "18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes ; Conference date: 03-08-2008 Through 06-08-2008",

}