Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

S. G. Choi; J. Zúñiga-Pérez; V. Muñoz-Sanjosé; A. G. Norman; C. L. Perkins; D. H. Levi

doi:10.1116/1.3498755

Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

S. G. Choi, J. Zúñiga-Pérez, V. Muñoz-Sanjosé, A. G. Norman, C. L. Perkins, D. H. Levi

Materials Science

Research output: Contribution to journal › Article › peer-review

22 Scopus Citations

Abstract

The authors report ellipsometrically determined optical properties of epitaxial cadmium oxide thin film grown by metal-organic vapor phase epitaxy on r -plane sapphire substrate. The ellipsometric data were collected from 0.74 to 6.45 eV with the sample at room temperature. Artifacts from the surface overlayers were reduced as far as possible by the premeasurement surface treatment procedures. Complex dielectric function ε= ε₁ +i ε₂ and refractive index N=n+ik spectra were extracted from multilayer modeling of the data with the B-spline functions.

Original language	American English
Pages (from-to)	1120-1124
Number of pages	5
Journal	Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
Volume	28
Issue number	6
DOIs	https://doi.org/10.1116/1.3498755 https://doi.org/10.1116/1.3498755
State	Published - 2010

NREL Publication Number

NREL/JA-5200-50565

Keywords

thin film solar cells

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Choi, S. G., Zúñiga-Pérez, J., Muñoz-Sanjosé, V., Norman, A. G., Perkins, C. L., & Levi, D. H. (2010). Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 28(6), 1120-1124. https://doi.org/10.1116/1.3498755, https://doi.org/10.1116/1.3498755

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title = "Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV",

abstract = "The authors report ellipsometrically determined optical properties of epitaxial cadmium oxide thin film grown by metal-organic vapor phase epitaxy on r -plane sapphire substrate. The ellipsometric data were collected from 0.74 to 6.45 eV with the sample at room temperature. Artifacts from the surface overlayers were reduced as far as possible by the premeasurement surface treatment procedures. Complex dielectric function ε= ε1 +i ε2 and refractive index N=n+ik spectra were extracted from multilayer modeling of the data with the B-spline functions.",

keywords = "thin film solar cells",

author = "Choi, {S. G.} and J. Z{\'u}{\~n}iga-P{\'e}rez and V. Mu{\~n}oz-Sanjos{\'e} and Norman, {A. G.} and Perkins, {C. L.} and Levi, {D. H.}",

year = "2010",

doi = "10.1116/1.3498755",

language = "American English",

volume = "28",

pages = "1120--1124",

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Choi, SG, Zúñiga-Pérez, J, Muñoz-Sanjosé, V, Norman, AG, Perkins, CL & Levi, DH 2010, 'Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV', Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, vol. 28, no. 6, pp. 1120-1124. https://doi.org/10.1116/1.3498755, https://doi.org/10.1116/1.3498755

Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV. / Choi, S. G.; Zúñiga-Pérez, J.; Muñoz-Sanjosé, V. et al.
In: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, Vol. 28, No. 6, 2010, p. 1120-1124.

Research output: Contribution to journal › Article › peer-review

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T1 - Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

AU - Choi, S. G.

AU - Zúñiga-Pérez, J.

AU - Muñoz-Sanjosé, V.

AU - Norman, A. G.

AU - Perkins, C. L.

AU - Levi, D. H.

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Y1 - 2010

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AB - The authors report ellipsometrically determined optical properties of epitaxial cadmium oxide thin film grown by metal-organic vapor phase epitaxy on r -plane sapphire substrate. The ellipsometric data were collected from 0.74 to 6.45 eV with the sample at room temperature. Artifacts from the surface overlayers were reduced as far as possible by the premeasurement surface treatment procedures. Complex dielectric function ε= ε1 +i ε2 and refractive index N=n+ik spectra were extracted from multilayer modeling of the data with the B-spline functions.

KW - thin film solar cells

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JO - Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

JF - Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics

IS - 6

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Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

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