Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

Dean Levi; C.L. Perkins; A.G. Norman; V. Muñoz-Sanjosé; J. Zúñiga-Pérez; S.G. Choi

doi:10.1116/1.3498755

Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

Dean Levi
, C.L. Perkins
, A.G. Norman
, V. Muñoz-Sanjosé
, J. Zúñiga-Pérez
, S.G. Choi

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	1120-1124
Number of pages	5
Journal	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume	28
Issue number	6
DOIs	https://doi.org/10.1116/1.3498755
State	Published - 2010

NLR Publication Number

NREL/JA-5200-50565

Keywords

thin film solar cells

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10.1116/1.3498755

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Levi, D., Perkins, C. L., Norman, A. G., Muñoz-Sanjosé, V., Zúñiga-Pérez, J., & Choi, S. G. (2010). Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, 28(6), 1120-1124. https://doi.org/10.1116/1.3498755

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title = "Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV",

keywords = "thin film solar cells",

author = "Dean Levi and C.L. Perkins and A.G. Norman and V. Mu{\~n}oz-Sanjos{\'e} and J. Z{\'u}{\~n}iga-P{\'e}rez and S.G. Choi",

year = "2010",

doi = "10.1116/1.3498755",

language = "American English",

volume = "28",

pages = "1120--1124",

journal = "Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures",

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Levi, D, Perkins, CL, Norman, AG, Muñoz-Sanjosé, V, Zúñiga-Pérez, J & Choi, SG 2010, 'Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV', Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, vol. 28, no. 6, pp. 1120-1124. https://doi.org/10.1116/1.3498755

Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV. / Levi, Dean; Perkins, C.L.; Norman, A.G. et al.
In: Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol. 28, No. 6, 2010, p. 1120-1124.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

AU - Levi, Dean

AU - Perkins, C.L.

AU - Norman, A.G.

AU - Muñoz-Sanjosé, V.

AU - Zúñiga-Pérez, J.

AU - Choi, S.G.

PY - 2010

Y1 - 2010

KW - thin film solar cells

UR - https://www.scopus.com/pages/publications/78650119682

U2 - 10.1116/1.3498755

DO - 10.1116/1.3498755

M3 - Article

SN - 1071-1023

VL - 28

SP - 1120

EP - 1124

JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

IS - 6

ER -

Complex Dielectric Function and Refractive Index Spectra of Epitaxial CdO Thin Film Grown on r-Plane Sapphire from 0.74 to 6.45 eV

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Keywords

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