Compositional and Electrical Co-Characterization of HgCdTe Diodes by Cross-Sectional EBIC, AVC, and AES Analysis

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)955-957
    Number of pages3
    JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
    Volume3
    Issue number3, Part I
    DOIs
    StatePublished - 1985

    Bibliographical note

    Work performed by Rocky Mountain Analytical Research Laboratories, Golden, Colorado, and Santa Barbara Research Center, Goleta, California

    NREL Publication Number

    • ACNR/JA-213-6617

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