@misc{a958ac3dcf154f2cb692791f56caed97,
title = "Considerations for a Standardized Test for Potential-Induced Degradation of Crystalline Silicon PV Modules (Presentation): NREL (National Renewable Energy Laboratory)",
abstract = "Over the past decade, there have been observations of module degradation and power loss because of the stress that system voltage bias exerts. This results in part from qualification tests and standards note adequately evaluating for the durability of modules to the long-term effects of high voltage bias that they experience in fielded arrays. This talk deals with factors for consideration,progress, and information still needed for a standardized test for degradation due to system voltage stress.",
keywords = "accelerated lifetime testing, module durability, module standards, photovoltaic modules, PID, potential-induced degradation, PV",
author = "Peter Hacke",
year = "2012",
language = "American English",
series = "Presented at the PV Module Reliability Workshop, 28 February - 2 March 2012, Golden, Colorado",
type = "Other",
}