Contactless Measurement of Recombination Lifetime in Photovoltaic Materials

Research output: Contribution to journalArticlepeer-review

35 Scopus Citations

Abstract

Contactless measurement of important semiconductor parameters has become the goal of current semiconductor diagnostics. Here we will describe an improved version of radio-frequency photoconductive decay operating in the ultra-high frequency (UHF) region Previous work has referred to the general technique as UHF photoconductive decay. This work will show that the improved technique is capable of measuring samples ranging in size from submicron thin films to large silicon ingots. The UHF frequency region is an ideal compromise for volume penetration and lifetime resolution with system response or 10 ns or less.

Original languageAmerican English
Pages (from-to)59-73
Number of pages15
JournalSolar Energy Materials and Solar Cells
Volume55
Issue number1-2
DOIs
StatePublished - 1998

NREL Publication Number

  • NREL/JA-520-25650

Keywords

  • Photovoltaics
  • Recombination

Fingerprint

Dive into the research topics of 'Contactless Measurement of Recombination Lifetime in Photovoltaic Materials'. Together they form a unique fingerprint.

Cite this