Abstract
Methods for treating a semiconductor material are provided. According to an aspect of the invention, the method includes annealing the semiconductor material in the presence of a compound that includes a first element and a second element. The first element provides an overpressure to achieve a desired stoichiometry of the semiconductor material, and the second element provides a dopant to the semiconductor material.
| Original language | American English |
|---|---|
| Patent number | 9,419,170 B2 |
| Filing date | 16/08/16 |
| State | Published - 2016 |
NREL Publication Number
- NREL/PT-5K00-67208
Keywords
- dopants
- semiconductor materials
- stoichiometry