Correction for Metastability in the Quantification of PID in Thin-film Module Testing: Preprint

Peter Hacke, Steven Johnston, Sergiu Spataru

Research output: Contribution to conferencePaper


A fundamental change in the analysis for the accelerated stress testing of thin-film modules is proposed, whereby power changes due to metastability and other effects that may occur due to the thermal history are removed from the power measurement that we obtain as a function of the applied stress factor. The power of reference modules normalized to an initial state - undergoing the same thermal and light- exposure history but without the applied stress factor such as humidity or voltage bias - is subtracted from that of the stressed modules. For better understanding and appropriate application in standardized tests, the method is demonstrated and discussed for potential-induced degradation testing in view of the parallel-occurring but unrelated physical mechanisms that can lead to confounding power changes in the module.
Original languageAmerican English
Number of pages6
StatePublished - 2017
Event2017 IEEE Photovoltaic Specialists Conference (PSVC) - Washington, D.C.
Duration: 25 Jun 201730 Jun 2017


Conference2017 IEEE Photovoltaic Specialists Conference (PSVC)
CityWashington, D.C.

Bibliographical note

See NREL/CP-5K00-73953 for paper as published in IEEE proceedings

NREL Publication Number

  • NREL/CP-5J00-68665


  • induced degradation testing
  • module power changes
  • modules
  • PV
  • stress testing
  • thin-film


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