Correlated Photoluminescence Spectroscopy Investigation of Grain Boundaries and Diffusion Processes in Nanocrystalline and Amorphous Silicon (nc-Si:H) Mixtures: Paper No. 1321-A08-11

doi:10.1557/opl.2011.1192

Correlated Photoluminescence Spectroscopy Investigation of Grain Boundaries and Diffusion Processes in Nanocrystalline and Amorphous Silicon (nc-Si:H) Mixtures: Paper No. 1321-A08-11

Research output: Contribution to conference › Paper

Original language	American English
Pages	279-284
Number of pages	6
DOIs	https://doi.org/10.1557/opl.2011.1192
State	Published - 2011
Event	2011 Materials Research Society Symposium - San Francisco, California Duration: 25 Apr 2011 → 29 Apr 2011

Conference

Conference	2011 Materials Research Society Symposium
City	San Francisco, California
Period	25/04/11 → 29/04/11

NREL Publication Number

NREL/CP-5200-53937

Keywords

defects
grain boundaries
photoluminescence

Access to Document

10.1557/opl.2011.1192

Cite this

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title = "Correlated Photoluminescence Spectroscopy Investigation of Grain Boundaries and Diffusion Processes in Nanocrystalline and Amorphous Silicon (nc-Si:H) Mixtures: Paper No. 1321-A08-11",

keywords = "defects, grain boundaries, photoluminescence",

author = "NREL",

year = "2011",

doi = "10.1557/opl.2011.1192",

language = "American English",

pages = "279--284",

note = "2011 Materials Research Society Symposium ; Conference date: 25-04-2011 Through 29-04-2011",

}

TY - CONF

T1 - Correlated Photoluminescence Spectroscopy Investigation of Grain Boundaries and Diffusion Processes in Nanocrystalline and Amorphous Silicon (nc-Si:H) Mixtures

T2 - 2011 Materials Research Society Symposium

AU - NREL, null

PY - 2011

Y1 - 2011

KW - defects

KW - grain boundaries

KW - photoluminescence

U2 - 10.1557/opl.2011.1192

DO - 10.1557/opl.2011.1192

M3 - Paper

SP - 279

EP - 284

Y2 - 25 April 2011 through 29 April 2011

ER -